Other highlights will include Anritsu’s high-performance test systems for leading-edge optical research and for the installation and maintenance of optical networks
Anritsu today announced that visitors to the ECOC 2015 exhibition (28-30 September, Valencia, Spain) will be able to see a demonstration of the recently released 64Gbps test platform for engineers investigating the latest Signal Integrity, Modulations, high speed PAM4 (pulse amplitude modulation) transmission techniques intended for use in 200Gbps and 400Gbps communications links.
The platform, which provides for very high-quality signal generation up to 64.2Gbps, consists of the Anritsu MP1800A Signal Quality Analyser (Bit Error Rate Tester, BERT), combined with the new MP1861A 64G Mux, MP1862A 64G Demux, MZ1854A PAM4 converter.
As a completely unique feature, this platform provides integrated capability to add multiple jitter stresses at any generated signal bit rate, for complete Jitter Tolerance & Signal Integrity simultaneous analysis. In this demonstration, the signal output is analysed by the 65GHz LabMaster oscilloscope from LeCroy.
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A second demonstration of the 64.2Gbps MP1800A platform will also be on view at ECOC 2015. This second set-up relies on the MP1800A excellent eye quality, extremely low intrinsic jitter and fast transition times, specified at data rates from 100Mbps to 64,2Gbps. Details will be available closer to the time or on the Anritsu stand.
